Semiconductor Industry - Overview
Semiconductor Materials
Crystal Growth and Wafer Preparation
Contamination Control
Wafer Fabrication - Overview
Process Yields
Epitaxy
Oxidation
Lithography
Reactive Plasma Etching
Film Deposition
Ion Implantation
Metallization
Wafer Test and Evaluation
Assembly and Packaging
Appendix
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Semicon China 2006
March 21-23, 2006
Shanghai New International Expo Center – SNIEC
Shanghai, China
FPD China 2006
March 28-30, 2006
Shanghai Mart
Shanghai, China
Semicon Europa 2006
Exhibition: 4–6 April
Programs & Events: 3–6 April
New Munich Trade Fair Centre
Munich, Germany
Semicon Singapore 2006
9-11 May 2006
Levels 4 and 6
Suntec Singapore International Convention & Exhibition Centre
Singapore
FPD Taiwan 2006
June 14–16, 2006
Taipei World Trade Center
Taipei, Taiwan
Semicon West 2006
July 10-14, 2006
Moscone Center
San Francisco, California, USA
Semicon Taiwan 2006
September 11–13, 2006
Taipei World Trade Center
Taipei, Taiwan
Semi Expo CIS Russia 2006
October 2–4, 2006
Moscow, Russia
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Conferences on Yield and ReliabilityYield Management Software Manufacturers
Defect and Yield Analysis
Yield Analysis
Analyzing Semiconductor Failure
Failure Analysis Is a Useful Feedback Tool for System Designers
Failure analysis techniques for semiconductors and other devices
Improving yield in IC manufacturing by statistical analysis of a large database
Investigating yield loss caused by airborne organophosphates
Model-based approach allows design for yield
Semiconductor Yield Links
Splitting Wafer Lots in Semiconductor Manufacturing Part I The Statistician's Toolbox
Understanding Soft and Firm Errors in Semiconductor Devices [PDF]
Using bitmap analysis to help identify yield-critical issues in the fab
VLSI chip yield demonstration - Applet
Yield Forecasting
Yield Management on Semiconductor International
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